DIN EN 60749-30 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011)
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 60721-3-5 Classification of Environmental Conditions Part 3: Classification of Groups of Environmental Parameters and Their Severities - Section 5: Ground Vehicle Installations - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- 13
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 60721-3-5 Classification of Environmental Conditions Part 3: Classification of Groups of Environmental Parameters and Their Severities - Section 5: Ground Vehicle Installations - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- 13.160
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 60721-3-5 Classification of Environmental Conditions Part 3: Classification of Groups of Environmental Parameters and Their Severities - Section 5: Ground Vehicle Installations - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- 35
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 60721-3-5 Classification of Environmental Conditions Part 3: Classification of Groups of Environmental Parameters and Their Severities - Section 5: Ground Vehicle Installations - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- 35.100
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 60721-3-5 Classification of Environmental Conditions Part 3: Classification of Groups of Environmental Parameters and Their Severities - Section 5: Ground Vehicle Installations - Edition 2.0
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 61000-4-8 Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test - Edition 2.0
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- BSI BS EN 61582 Radiation protection instrumentation In vivo counters Classification, general requirements and test procedures for portable, transportable and installed equipment
- IEC 60721-3-5 Classification of Environmental Conditions Part 3: Classification of Groups of Environmental Parameters and Their Severities - Section 5: Ground Vehicle Installations - Edition 2.0
- CEI EN 61287-1 Railway applications - Power convertors installed on board rolling stock Part 1: Characteristics and test methods
- IEC 60747-15 Semiconductor devices – Discrete devices – Part 15: Isolated power semiconductor devices - Edition 2.0
- IEC 60749-5 Semiconductor Devices - Mechanical and Climatic Test Methods - Part 5: Steady-State Temperature Humidity Bias Life Test - Edition 1.0; Replaces IEC/PAS 62161
- CENELEC CLC/TR 62685 Industrial communication networks - Profiles - Assessment guideline for safety devices using IEC 61784-3 functional safety communication profiles (FSCPs)
- Картотека зарубежных и международных стандартов
Ссылается на
- В списке элементов: 14
- CENELEC EN 60749-20 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heatПолупроводниковые устройства - Механические и климатические методы тестирования - Часть 20: Сопротивление пластмассы инкапсулировало SMDs к совместному воздействию влажности и спаивающий тепло
Карточка документа - IEC 60749-20 Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat - Edition 2.0Полупроводниковые устройства – Механические и климатические методы тестирования – Часть 20: Сопротивление пластмассы инкапсулировало SMDs к совместному воздействию влажности и спаивающий тепло - Выпуск 2.0
Карточка документа - CENELEC EN 60749-33 Semiconductor devices Mechanical and climatic test methods Part 33: Accelerated moisture resistance Unbiased autoclaveПолупроводниковые устройства Механическая и климатическая Часть 33 методов тестирования: Ускоренная влагостойкость Несмещенный автоклав
Карточка документа - CENELEC EN 60749-24 Semiconductor devices Mechanical and climatic test methods Part 24: Accelerated moisture resistance Unbiased HASTПолупроводниковые устройства Механическая и климатическая Часть 24 методов тестирования: Ускоренная влагостойкость Несмещенный HAST
Карточка документа - IEC 60749-33 Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave - Edition 1.0; Replaces IEC PAS 62172:2000Полупроводниковые устройства - Механические и климатические методы тестирования - Часть 33: Ускоренная влагостойкость - Несмещенный автоклав - Выпуск 1.0; Замены IEC PAS 62172:2000
Карточка документа - IEC 60749-24 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST - Edition 1.0; Replaces IEC PAS 62336:2002Полупроводниковые устройства - Механические и климатические методы тестирования - Часть 24: Ускоренная влагостойкость - Несмещенный HAST - Выпуск 1.0; Замены IEC PAS 62336:2002
Карточка документа - CENELEC EN 60749-25 Semiconductor devices Mechanical and climatic test methods Part 25: Temperature cyclingПолупроводниковые устройства Механическая и климатическая Часть 25 методов тестирования: Температурное циклическое повторение
Карточка документа - IEC 60749-4 CORR 1 Semiconductor Devices - Mechanical and Climatic Test Methods - Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (HAST) CORRIGENDUM 1 - Edition 1.0Полупроводниковые устройства - механические и климатические методы тестирования - часть 4: влажное тепло, устойчивое состояние, Высоко ускоренный тест напряжения (HAST) CORRIGENDUM 1 - выпуск 1.0
Карточка документа - IEC 60749-11 CORR 2 Semiconductor Devices - Mechanical and Climatic Test Methods - Part 11: Rapid Change of Temperature - Two-Fluid-Bath Method CORRIGENDUM 2 - Edition 1.0Полупроводниковые устройства - механические и климатические методы тестирования - часть 11: быстрое изменение температуры - метода CORRIGENDUM 2 с двумя Жидкими Ваннами - выпуск 1.0
Карточка документа - IEC 60749-25 Semiconductor devices Mechanical and climatic test methods Part 25: Temperature cycling - Edition 1.0Полупроводниковые устройства Механическая и климатическая Часть 25 методов тестирования: циклическое повторение Температуры - Выпуск 1.0
Карточка документа - CENELEC EN 60749-5 Semiconductor devices Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life testПолупроводниковые устройства Механическая и климатическая Часть 5 методов тестирования: влажность Температуры установившегося процесса смещает испытания на долговечность
Карточка документа - IEC 60749-5 Semiconductor Devices - Mechanical and Climatic Test Methods - Part 5: Steady-State Temperature Humidity Bias Life Test - Edition 1.0; Replaces IEC/PAS 62161Полупроводниковые приборы - механические и климатические Методы испытаний - Часть 5: установившиеся температуры и влажности уклон жизни тест - издание 1.0; заменяет МЭК/пас 62161
Карточка документа - CENELEC EN 60749-4 Semiconductor Devices Mechanical and Climatic Test Methods Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (HAST)Полупроводниковые устройства механическая и климатическая часть 4 методов тестирования: влажное тепло, устойчивое состояние, Высоко ускоренный тест напряжения (HAST)
Карточка документа - CENELEC EN 60749-11 Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath MethodПолупроводниковые устройства механическая и климатическая часть 11 методов тестирования: быстрое изменение температурного метода с двумя Жидкими Ваннами
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