BSI BS QC 760200 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- DIN EN 1012-3 Compressors and vacuum pumps - Safety requirements - Part 3: Process compressors
- CEN EN 626-1 Safety of machinery - Reduction of risks to health from hazardous substances emitted by machinery - Part 1: Principles and specifications for machinery manufacturers - Incorporates Amendment A1: 2008
- BSI BS EN 953 + A1 Safety of machinery - Guards - General requirements for the design and construction of fixed and movable guards - AMD: April 30, 2009
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN 953 + A1 Safety of machinery - Guards - General requirements for the design and construction of fixed and movable guards - AMD: April 30, 2009
- CEN EN 626-1 Safety of machinery - Reduction of risks to health from hazardous substances emitted by machinery - Part 1: Principles and specifications for machinery manufacturers - Incorporates Amendment A1: 2008
- CEN EN 626-1 Safety of machinery - Reduction of risks to health from hazardous substances emitted by machinery - Part 1: Principles and specifications for machinery manufacturers - Incorporates Amendment A1: 2008
- BSI BS EN 953 + A1 Safety of machinery - Guards - General requirements for the design and construction of fixed and movable guards - AMD: April 30, 2009
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN 953 + A1 Safety of machinery - Guards - General requirements for the design and construction of fixed and movable guards - AMD: April 30, 2009
- BSI BS EN 953 + A1 Safety of machinery - Guards - General requirements for the design and construction of fixed and movable guards - AMD: April 30, 2009
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN 1012-1 Compressors and vacuum pumps - Safety requirements Part 1: Air compressors
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN ISO 14122-3 + A1 Safety of machinery - Permanent means of access to machinery - Part 3: Stairways, stepladders and guard-rails - AMD: August 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 1846-2 + A1 Firefighting and rescue service vehicles Part 2: Common requirements - Safety and performance - CORR: November 30, 2010; AMD: August 31, 2013
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- BSI BS EN 60204-1 + A1 Safety of machinery. Electrical equipment of machines. Part 1: General requirements - AMD: April 30, 2009; CORR: May 31, 2010
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- IEC 60748-20 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Edition 1.0; Includes Amendment 1: 9/1995
- BSI BS QC 760200 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760201 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- DIN EN 1012-3 Compressors and vacuum pumps - Safety requirements - Part 3: Process compressors
- Картотека зарубежных и международных стандартов
British Standards Institution
Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
N BS QC 760200
Annotation
To be read in conjunction with BS QC 760000:1990
Автоматический перевод:
Согласованная система качественной оценки для устройств полупроводника электронных компонентов - интегральных схем - частная спецификация для пленочных интегральных схем и гибридных пленочных интегральных схем на основе процедур одобрения возможности
Быть считанным в сочетании с BS QC 760000:1990
Эквиваленты данного стандарта:
