CENELEC EN 62047-6 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- IEC 62047-6 Semiconductor devices – Micro-electromechanical devices – Part 6: Axial fatigue testing methods of thin film materials - Edition 1.0
- 31
- IEC 62047-6 Semiconductor devices – Micro-electromechanical devices – Part 6: Axial fatigue testing methods of thin film materials - Edition 1.0
- 31.080
- IEC 62047-6 Semiconductor devices – Micro-electromechanical devices – Part 6: Axial fatigue testing methods of thin film materials - Edition 1.0
- 31.080.99
- CENELEC EN 62047-18 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
- CENELEC EN 62047-18 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
- CENELEC EN 62047-6 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
- DIN EN 62047-18 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (IEC 62047-18:2013)
- Картотека зарубежных и международных стандартов
