SAE AS6171/3 Techniques for Suspect/Counterfeit EEE Parts Detection by X-ray Fluorescence Test Methods
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- SAE AS6171/2 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- 29
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- 29.035
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- DLA MIL-STD-883K CHANGE 1 TEST METHOD STANDARD MICROCIRCUITS
- SAE AS6171/5 Techniques for Suspect/Counterfeit EEE Parts Detection by Radiological Test Methods
- SAE AS6171/4 Techniques for Suspect/Counterfeit EEE Parts Detection by Delid/Decapsulation Physical Analysis Test Methods
- SAE AS6171/11 Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
- SAE AS6171 Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts
- Картотека зарубежных и международных стандартов
Ссылается на
- В списке элементов: 4
- SAE AS6171 Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical PartsСтандарт Методов испытаний; Общие требования, Подозреваемый/Подделка, Электрические, Электронные, и Электромеханические Части
Карточка документа - ISO ISO/IEC 17025 CORR 1 General requirements for the competence of testing and calibration laboratories TECHNICAL CORRIGENDUM 1 - Second editionОбщие требования для компетентности лабораторий тестирования и калибровки ТЕХНИЧЕСКОЕ ИСПРАВЛЕНИЕ 1 - Второй выпуск
Карточка документа - ISO 3497 Metallic Coatings - Measurement of Coating Thickness - X-Ray Spectrometric Methods - Third EditionМеталлические покрытия - измерение толщины покрытия - делает рентген спектральных методов - третий выпуск
Карточка документа - ASTM B568 Standard Test Method for Measurement of Coating Thickness by X-Ray SpectrometryМетод стандартной пробы для измерения толщины покрытия спектрометрией рентгена
Карточка документа
