SAE International

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
 N AS6171/2

Annotation

This document describes the requirements of the following test methods for counterfeit detection of electronic components:

a. Method A: General External Visual Inspection (EVI), Sample Selection, and Handling

b. Method B: Detailed EVI

c. Method C: Testing for Remarking and Resurfacing

d. Method D: Surface Texture Analysis by SEM

NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.

Purpose Statement

This standard establishes requirements for the inspection process, documentation of results, personnel qualification, and the inspection equipment to be used. It also outlines techniques to detect suspect counterfeit parts by a trained inspector.

Автоматический перевод:

Методы для Подозреваемого/Подделки Обнаружение Частей EEE Внешним Визуальным контролем, Замечание и Перевсплытие и Поверхностные Аналитические Методы испытаний Структуры