BSI BS ISO 22489 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- BSI BS ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
- 37
- BSI BS ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
- 37.020
- ISO TS 24597 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness - First Edition
- ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification - First Edition
- ISO TS 24597 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness - First Edition
- ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification - First Edition
- BSI BS ISO 22309 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
- Картотека зарубежных и международных стандартов
