BSI BS ISO 22489 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- BSI BS ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
- 37
- BSI BS ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
- 37.020
- ISO TS 24597 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness - First Edition
- ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification - First Edition
- ISO TS 24597 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness - First Edition
- ISO 16700 Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification - First Edition
- BSI BS ISO 22309 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
- Картотека зарубежных и международных стандартов
British Standards Institution
Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
N BSI BS ISO 22489
Автоматический перевод:
Анализ микролуча - Электронно-зондовый анализ - Количественный анализ пункта для оптовых экземпляров с помощью дисперсионной длиной волны Рентгеноспектроскопии
Эквиваленты данного стандарта:
- BSI BS ISO 22309 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
- BSI BS ISO 14595 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
- ISO 17470 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry - Second Edition
- ISO 22489 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy - Second Edition
- ISO ISO/IEC 17025 CORR 1 General requirements for the competence of testing and calibration laboratories TECHNICAL CORRIGENDUM 1 - Second edition
- BSI BS ISO 23833 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
