BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
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- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
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- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- 31.140
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- Картотека зарубежных и международных стандартов
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- BSI BS EN 61240 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rulesПьезоэлектрические устройства - Подготовка контурных рисунков смонтированных поверхностью устройств (SMD) для управления частотой и выбора - Общие правила
Карточка документа - IEC 61240 Piezoelectric devices – Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection – General rules - Edition 2.0Пьезоэлектрические устройства – Подготовка контурных рисунков смонтированных поверхностью устройств (SMD) для управления частотой и выбора – Общих правил - Издание 2.0
Карточка документа - IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0Измерение параметров модуля кристалла кварца нулевым методом фазы в сети пи - часть 1: основной метод для измерения резонансной частоты и резонансного сопротивления модулей кристалла кварца нулевым методом фазы в сети пи - выпуск 2.0
Карточка документа - BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997Измерение части 5 параметров модуля кристалла кварца: методы для определения эквивалентных электрических параметров Используя автоматические методы анализатора сетей и коррекцию ошибок - AMD 9661: октябрь 1997
Карточка документа - IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0Измерение параметров модуля кристалла кварца - часть 5: методы для определения эквивалентных электрических параметров Используя автоматические методы анализатора сетей и коррекцию ошибок - выпуск 1.0
Карточка документа - BSI BS EN 60444-1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - AMD 9657: October 1997; AMD 10908: August 2000Измерение Параметров Модуля Кристалла кварца Нулевым Методом Фазы в Сети Пи - Часть 1: Основной метод для Измерения Резонансной частоты и Резонансного Сопротивления Модулей Кристалла кварца Нулевым Методом Фазы в Сети Пи - AMD 9657: октябрь 1997; AMD 10908: август 2000
Карточка документа - BSI BS EN 60444-2 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a pi-Network - Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units - AMD 9658: October 1997Измерение Параметров Модуля Кристалла кварца Нулевым Методом Фазы в сети пи - Часть 2: Метод Смещения Фазы для Измерения Двигательной Емкости Модулей Кристалла кварца - AMD 9658: октябрь 1997
Карточка документа - IEC TR 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 4: Method for the Measurement of the Load Resonance Frequency FL, Load Resonance Resistance RL and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - Edition 1.0Измерение Параметров Модуля Кристалла кварца Нулевым Методом Фазы в Части сети PI 4: Метод для Измерения Резонансной частоты Загрузки FL, Сопротивление Резонанса Загрузки RL и Вычисление Других Полученных Значений Модулей Кристалла кварца, до 30 МГц - Выпуск 1.0
Карточка документа - IEC 60444-2 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units - Edition 1.0Измерение параметров модуля кристалла кварца нулевым методом фазы в части сети PI 2: метод смещения фазы для измерения двигательной емкости модулей кристалла кварца - выпуск 1.0
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