BSI BS EN 60444-2 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a pi-Network - Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units - AMD 9658: October 1997
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Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
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- CENELEC HD 323.2.40 S1 Basic Environmental Testing Procedures - Part 2: Tests Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- 19
- CENELEC HD 323.2.40 S1 Basic Environmental Testing Procedures - Part 2: Tests Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- CENELEC HD 323.2.40 S1 Basic Environmental Testing Procedures - Part 2: Tests Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI PD IEC TR 60721-4-1 Classification of Environmental Conditions - Part 4-1: Guidance for the Correlation and Transformation of Environmental Condition Classes of IEC 60721-3 to the Environmental Tests of IEC 60068 - Storage - AMD 14597: October 10, 2003
- IEC 60068-2-13 Basic Environmental Testing Procedures Part 2: Tests Test M: Low Air Pressure - Edition 4.0
- BSI BS EN 60068-2-41 Environmental Testing - Part 2: Tests - Test Z/BM: Combined dry Heat/Low Air Pressure Tests
- BSI BS EN 60068-3-2 Environmental Testing - Part 3: Background Information - Section 2: Combined Temperature/Low Air Pressure Tests
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-3-2 Environmental Testing - Part 3: Background Information - Section 2: Combined Temperature/Low Air Pressure Tests
- BSI BS EN 60068-2-41 Environmental Testing - Part 2: Tests - Test Z/BM: Combined dry Heat/Low Air Pressure Tests
- IEC 60068-2-13 Basic Environmental Testing Procedures Part 2: Tests Test M: Low Air Pressure - Edition 4.0
- BSI BS EN 60068-2-41 Environmental Testing - Part 2: Tests - Test Z/BM: Combined dry Heat/Low Air Pressure Tests
- BSI BS EN 60068-3-2 Environmental Testing - Part 3: Background Information - Section 2: Combined Temperature/Low Air Pressure Tests
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-3-2 Environmental Testing - Part 3: Background Information - Section 2: Combined Temperature/Low Air Pressure Tests
- BSI BS EN 60068-3-2 Environmental Testing - Part 3: Background Information - Section 2: Combined Temperature/Low Air Pressure Tests
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-40 Environmental Testing - Part 2: Tests - Test Z/AM: Combined Cold/Low Air Pressure Tests
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- BSI BS EN 60068-2-13 Environmental Testing - Part 2: Tests - Test M: Low Air Pressure
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC 60068-2-40 AMD 1 Amendment 1 Basic environmental testing procedures – Part 2-40: Tests – Test Z/AM: Combined cold/low air pressure tests - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC TR 62131-5 Environmental conditions - Vibration and shock of electrotechnical equipment - Part 5: Equipment during storage and handling - Edition 1.0
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- IEC 60068-2-21 CORR 1 Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices - Edition 6.0
- IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- BSI BS EN 60758 Synthetic quartz crystal - Specifications and guidelines for use
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- BSI BS EN 60444-4 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 4: Methods for the Measurement of the Load Resonance Frequency fL, Load Resonance Resistance RL, and the Calculation of Other Derived Values of Quartz Crystal Units, up to 30 MHz - AMD 9660: October 1997
- BSI BS EN 60444-1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - AMD 9657: October 1997; AMD 10908: August 2000
- CENELEC HD 323.2.40 S1 Basic Environmental Testing Procedures - Part 2: Tests Test Z/AM: Combined Cold/Low Air Pressure Tests
- Картотека зарубежных и международных стандартов
British Standards Institution
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a pi-Network - Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units - AMD 9658: October 1997
N BS EN 60444-2
Автоматический перевод:
Измерение Параметров Модуля Кристалла кварца Нулевым Методом Фазы в сети пи - Часть 2: Метод Смещения Фазы для Измерения Двигательной Емкости Модулей Кристалла кварца - AMD 9658: октябрь 1997
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