ASTM F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
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Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM ISO/ASTM 51205 Standard Practice for Use of a Ceric-Cerous Sulfate Dosimetry System
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- 13
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- 13.060
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- 13.060.50
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D3082 Standard Test Method for Boron in Water
- ASTM D5810 Standard Guide for Spiking into Aqueous Samples
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D5996 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM D3864 Standard Guide for On-Line Monitoring Systems for Water Analysis
- ASTM E178 Standard Practice for Dealing With Outlying Observations
- ASTM E666 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
- ASTM F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
- ASTM F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
- Картотека зарубежных и международных стандартов
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- ASTM E668 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic DevicesУтвержденный технологический процесс для приложения дозиметрии термолюминесценции (TLD) системы для определения поглощенной дозы на Лучевом Испытании на твердость электронных приборов
Карточка документа - ASTM F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor DevicesРуководство для измерения ионизации жизнеспособности мощности дозы и перегорания полупроводниковых устройств
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