IEC 60748-21 Semiconductor Devices - Integrated Circuits - Part 21: Sectional Specification for Film Integrated Circuits and Hybrid Film Intergrated Circuits on the Basis of Qualification Approval Procedures - Edition 2.0; IECQ QC 760100
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- BSI BS QC 760101 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of Qualification Approval Procedures
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- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- Картотека зарубежных и международных стандартов
На него ссылаются
- В списке элементов: 3
- IEC 61360-1 Standard data elements types with associated classification scheme for electric items – Part 1: Definitions – Principles and methods - Edition 3.0Стандартные элементы данных вводят со связанной системой классификации для электрических элементов – Часть 1: Определения – Принципы и методы - Выпуск 3.0
Карточка документа - DIN EN 60027-2 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics (IEC 60027-2:2005)Буквенные обозначения, которые будут использоваться в электротехнике - Часть 2: Телекоммуникации и электроника (60027-2:2005 IEC)
Карточка документа - BSI BS IEC 60748-1 Semiconductor Devices Integrated Circuits Part 1: General - CORR 14064: August 30, 2002Полупроводниковая часть 1 интегральных схем устройств: общий - CORR 14064: 30 августа 2002
Карточка документа
