IEC 60748-21 Semiconductor Devices - Integrated Circuits - Part 21: Sectional Specification for Film Integrated Circuits and Hybrid Film Intergrated Circuits on the Basis of Qualification Approval Procedures - Edition 2.0; IECQ QC 760100
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- BSI BS QC 760101 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of Qualification Approval Procedures
- 31
- BSI BS EN ISO 13849-1 Safety of machinery - Safety-related parts of control systems Part 1: General principles for design - CORR: August 31, 2010
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60447 Basic and safety principles for man-machine interface, marking and identification Actuating principles - Edition 3.0
- CENELEC EN 61175-1 Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- IEC 60747-2 Semiconductor Devices - Discrete Devices and Integrated Circuits Part 2: Rectifier Diodes - Edition 2.0
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- Картотека зарубежных и международных стандартов
International Electrotechnical Commission
Semiconductor Devices - Integrated Circuits - Part 21: Sectional Specification for Film Integrated Circuits and Hybrid Film Intergrated Circuits on the Basis of Qualification Approval Procedures - Edition 2.0; Q QC 760100
N 60748-21
Автоматический перевод:
Полупроводниковые устройства - интегральные схемы - часть 21: частная спецификация для пленочных интегральных схем и гибридного фильма межтерла схемы на основе процедур одобрения квалификации - выпуск 2.0; IECQ QC 760100
Эквиваленты данного стандарта:
Уважаемый пользователь!
Обратитесь к обслуживающему Вас представителю за дополнительной информацией о возможности приобретения документов указанного разработчика и заказа перевода.
