IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
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Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
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- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- 13.200
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
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- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60410 Sampling plans and procedures for inspection by attributes - Edition 1.0
- IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0
- IEC 60749-23 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life - Edition 1.1 Consolidated Reprint
- BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
- IEC 60749-3 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 3: External visual examination CORRIGENDUM 1 - Edition 1.0
- CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- Картотека зарубежных и международных стандартов
На него ссылаются
- В списке элементов: 11
- IEC 60747-5-6 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes - Edition 1.0Полупроводниковые устройства - Часть 5-6: Оптоэлектронные устройства - Светодиоды - Выпуск 1.0
Карточка документа - BSI PD IEC/TS 62686-1 Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductorsУправление процессами для авиационной радиоэлектроники - Электронные компоненты для космоса, защиты и высокой эффективности (ADHP) заявления Часть 1: Общие требования для высоких интегральных схем надежности и дискретных полупроводников
Карточка документа - IEC TS 62686-1 Process management for avionics – Electronic components for aerospace, defence and high performance (ADHP) applications – Part 1: General requirements for high reliability integrated circuits and discrete semiconductors - Edition 2.0Управление процессами для авиационной радиоэлектроники – Электронных компонентов для космоса, защиты и высокой эффективности (ADHP) заявления – Часть 1: Общие требования для высоких интегральных схем надежности и дискретных полупроводников - Издание 2.0
Карточка документа - BSI BS EN 60747-15 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devicesПолупроводниковые устройства - Дискретные устройства - Часть 15: Изолированные устройства полупроводника питания
Карточка документа - CEI EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cyclingПолупроводниковые устройства - Механическая и климатическая Часть 34 методов тестирования: Цикл включения и выключения питания
Карточка документа - BSI BS EN 60749-34 Semiconductor devices - Mechanical and climatic test methods Part 34: Power cyclingПолупроводниковые устройства - Механическая и климатическая Часть 34 методов тестирования: Цикл включения и выключения питания
Карточка документа - CENELEC EN 60749-34 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cyclingПолупроводниковые устройства - Механические и климатические методы тестирования - Часть 34: Цикл включения и выключения питания
Карточка документа - IEC 60749-34 Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling - Edition 2.0Полупроводниковые устройства – Механические и климатические методы тестирования – Часть 34: Цикл включения и выключения питания - Выпуск 2.0
Карточка документа - BSI BS EN 60749-20 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heatПолупроводниковые устройства - Механические и климатические методы тестирования - Часть 20: Сопротивление пластмассы инкапсулировало SMDs к совместному воздействию влажности и спаивающий тепло
Карточка документа - IEC 60747-14-1 Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors - Edition 2.0Полупроводниковые устройства – Часть 14-1: Полупроводниковые датчики – Универсальная спецификация для датчиков - Выпуск 2.0
Карточка документа - BSI BS EN 60749-11 CORR 1 Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method - CORR 14681: October 24 2003Устройства полупроводника CORR 1 механическая и климатическая часть 11 методов тестирования: быстрое изменение температурного метода с двумя Жидкими Ваннами - CORR 14681: 24 октября 2003
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