SAE AS6171/6 Techniques for Suspect/Counterfeit EEE Parts Detection by Acoustic Microscopy (AM) Test Methods
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- SAE AS6171/2 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
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- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- 29.035
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- DLA MIL-STD-883K CHANGE 1 TEST METHOD STANDARD MICROCIRCUITS
- SAE AS6171/5 Techniques for Suspect/Counterfeit EEE Parts Detection by Radiological Test Methods
- SAE AS6171/4 Techniques for Suspect/Counterfeit EEE Parts Detection by Delid/Decapsulation Physical Analysis Test Methods
- SAE AS6171/11 Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
- SAE AS6171 Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts
- Картотека зарубежных и международных стандартов
SAE International
Techniques for Suspect/Counterfeit EEE Parts Detection by Acoustic Microscopy (AM) Test Methods
N AS6171/6
Annotation
Through the use of ultra-high frequency ultrasound, typically above 10 MHz, Acoustic Microscopy (AM) non-destructively finds and characterizes physical features and latent defects (visualization of interior features in a layer by layer process) - such as material continuity and discontinuities, sub-surface flaws, cracks, voids, delaminations and porosity. AM observed features and defects can be indicators that the components were improperly handled, stored, altered or previously used.
If AS6171/6 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Purpose
The purpose of this document is to provide recommended techniques and guidelines for the use of Acoustic Microscopy for detection of counterfeit electronic components
Автоматический перевод:
Методы для Подозреваемого/Подделки Обнаружение Частей EEE Методами испытаний Акустической микроскопии (AM)
С помощью ультравысокочастотного ультразвука, обычно выше 10 МГц, Акустическая микроскопия (AM) непагубно находит и характеризует геоэкологические характеристики и скрытые дефекты (визуализация внутренних особенностей в уровне процессом уровня) - такие как существенная непрерывность и неоднородности, недостатки недр, трещины, пустоты, расслаивания и пористость. AM наблюдал особенности, и дефекты могут быть индикаторами, что компоненты были неправильно обработаны, сохранены, изменялись или ранее использовались.
