SAE AS6171/1 Suspect/Counterfeit Test Evaluation Method
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- SAE AS6171/2 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
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- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- 29.035
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- DLA MIL-STD-883K CHANGE 1 TEST METHOD STANDARD MICROCIRCUITS
- SAE AS6171/5 Techniques for Suspect/Counterfeit EEE Parts Detection by Radiological Test Methods
- SAE AS6171/4 Techniques for Suspect/Counterfeit EEE Parts Detection by Delid/Decapsulation Physical Analysis Test Methods
- SAE AS6171/11 Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
- SAE AS6171 Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts
- Картотека зарубежных и международных стандартов
SAE International
Suspect/Counterfeit Test Evaluation Method
N AS6171/1
Annotation
This document describes an assessment of the effectiveness of a specified test plan used to screen for counterfeit parts. The assessment includes the determination of the types of defects detected using a specified test plan along with the related counterfeit type coverage. The output of this evaluation will produce Counterfeit Defect Coverage (CDC), Counterfeit Type Coverage (CTC), Not-Covered Defects (NCDs), and Under-Covered Defects (UCDs). This information will be supplied to the test laboratory’s customer in both the test report and the Certificate of Quality Conformance (CoQC). This evaluation method does not address the effectiveness of detecting tampered type devices.
The Test Evaluation Method also describes an Optimized Test Sequence Selection, in which a test sequence is selected that maximizes the CDC utilizing test cost and time as constraints, for any tier level except the Critical Risk Level. The constraints can be adjusted until the desired CDC is achieved. The output of the Optimized Test Sequence Selection also includes CTC, NCDs, and UCDs.
If AS6171/1 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Автоматический перевод:
Испытательный Метод Оценки подозреваемого/Подделки
Этот документ описывает оценку эффективности указанного испытательного плана, используемого для отбора на поддельные части. Оценка включает определение типов дефектов, обнаруженных с помощью указанного испытательного плана наряду со связанным поддельным покрытием типа. Результат этой оценки произведет Поддельное покрытие дефекта (CDC), Поддельное покрытие типа (CTC), Не - Охваченные Дефекты (NCDs), и Под - Охваченные Дефекты (UCDs). Эта информация будет предоставлена клиенту испытательной лаборатории и в отчете об испытаниях и в Соответствии сертификата качества (CoQC). Этот метод оценки не обращается к эффективности обнаружения вмешавшихся устройств типа.
