BSI BS EN 60122-3 Quartz crystal units of assessed quality Part 3: Standard outlines and lead connections
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- 31
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- 31.140
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- IEC 61240 Preparation of Outline Drawings of Surface-Mounted Devices (SMD) for Frequency Control and Selection - General Rules - Edition 1.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- IEC 60444-6 Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD) - Edition 2.0
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- Картотека зарубежных и международных стандартов
Ссылается на
- В списке элементов: 9
- BSI BS EN ISO 1101 Geometrical Product Specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-outГеометрические технические характеристики изделия (GPS) - Геометрический tolerancing - Допуски формы, ориентация, местоположение и выход
Карточка документа - BSI BS EN 60122-1 Quartz crystal units of assessed quality - Part 1: Generic specificationМодули кристалла кварца оцененного качества - Часть 1: Универсальная спецификация
Карточка документа - IEC 60122-1 Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification - Edition 3.0; Replaces IEC 61178-1, 1983 and IEC 60302, 1969Модули кристалла кварца оцененного качества - часть 1: универсальная спецификация - выпуск 3.0; замены IEC 61178-1, 1983 и IEC 60302, 1969
На основе IEC 60122-1 разработан ГОСТ Р МЭК 60122-1-2009 (IDT)ГОСТ Р МЭК 60122-1-2009 (IDT) - IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0Модули кристалла кварца для части 2 подстройки частоты и выбора: руководство по использованию модулей кристалла кварца для подстройки частоты и выбора - разделяет тот: модули кристалла кварца для предоставления часов микропроцессора - выпуск 1.0
Карточка документа - IEC 61178-3 Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional Specification - Qualification Approval - Edition 1.0Модули кристалла кварца - спецификация в качественной системе оценки IEC для электронных компонентов (IECQ) часть 3: частная спецификация - одобрение квалификации - выпуск 1.0
Карточка документа - IEC 61178-2 Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional Specification - Capability Approval - Edition 1.0Модули кристалла кварца - спецификация в качественной системе оценки IEC для электронных компонентов (IECQ) часть 2: частная спецификация - одобрение возможности - выпуск 1.0
Карточка документа - IEC 61178-3-1 Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional Specification - Qualification Approval Section 1: Blank Detail Specification - Edition 1.0Модули кристалла кварца - спецификация в качественной системе оценки IEC для электронных компонентов (IECQ) часть 3: частная спецификация - раздел одобрения квалификации 1: пустая спецификация детали - выпуск 1.0
Карточка документа - IEC 61178-2-1 Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional Specification - Capability Approval - Section 1: Blank Detail Specification - Edition 1.0Модули кристалла кварца - спецификация в качественной системе оценки IEC для электронных компонентов (IECQ) часть 2: частная спецификация - одобрение возможности - разделяет 1: пустая спецификация детали - выпуск 1.0
Карточка документа - IEC 60122-2 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Edition 2.0Модули кристалла кварца для части 2 подстройки частоты и выбора: руководство по использованию модулей кристалла кварца для подстройки частоты и выбора - выпуск 2.0
Карточка документа
