BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
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- Картотека зарубежных и международных стандартов
- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
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- BSI BS EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - AMD 9661: October 1997
- 31.140
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-1 AMD 1 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - Edition 2.0
- BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
- Картотека зарубежных и международных стандартов
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- BSI BS EN 60444-11 Measurement of quartz crystal unit parameters Part 11: Standard method for the determination of the load resonance frequency ?L and the effective load capacitance CLeff using automatic network analyzer techniques and error correctionИзмерение Части 11 параметров модуля кристалла кварца: Стандартный метод для определения ?L резонансной частоты загрузки и эффективной емкости загрузки ЦЛЕВ, использующий автоматические методы анализатора сетей и коррекцию ошибок
Карточка документа - BSI BS EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal unitsИзмерение Части 8 параметров модуля кристалла кварца: Тестовое приспособление для поверхности смонтировало модули кристалла кварца
Карточка документа - BSI BS EN 60122-1 Quartz crystal units of assessed quality - Part 1: Generic specificationМодули кристалла кварца оцененного качества - Часть 1: Универсальная спецификация
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