IEC 60747-8 Semiconductor devices – Discrete devices – Part 8: Field-effect transistors - Edition 3.0
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
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- CSA CAN/CSA-C22.2 NO. 60335-1:11 Safety of Household and Similar Appliances — Part 1: General Requirements - First Edition
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- IEC 60335-2-3 AMD 1 AMENDMENT 1 Household and similar electrical appliances – Safety – Part 2-3: Particular requirements for electric irons - Edition 6.1; Consolidated Reprint
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- IEC 60245-3 AMD 2 AMENDMENT 2 Rubber insulated cables – Rated voltages up to and including 450/750 V – Part 3: Heat resistant silicone insulated cables - Edition 2.0
- CSA CAN/CSA-C22.2 NO. 60335-1:11 Safety of Household and Similar Appliances — Part 1: General Requirements - First Edition
- IEC 60695-10-2 Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test method - Edition 3.0
- IEC 60335-2-12 Household and similar electrical appliances – Safety – Part 2-12: Particular requirements for warming plates and similar appliances - Edition 5.1 Consolidated Reprint
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- IEC 60034-1 Rotating electrical machines – Part 1: Rating and performance - Edition 12.0
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- CSA CAN/CSA-C22.2 NO. 60335-1:11 Safety of Household and Similar Appliances — Part 1: General Requirements - First Edition
- IEC 60695-10-2 Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test method - Edition 3.0
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- IEC 60747-16-1 Semiconductor devices – Part 16-1: Microwave integrated circuits – Amplifiers - Edition 1.1 Consolidated Reprint
- IEC 60747-1 Semiconductor devices – Part 1: General - Edition 2.1 Consolidated Reprint
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- IEC 60034-1 Rotating electrical machines – Part 1: Rating and performance - Edition 12.0
- IEC 60335-2-12 Household and similar electrical appliances – Safety – Part 2-12: Particular requirements for warming plates and similar appliances - Edition 5.1 Consolidated Reprint
- IEC 60695-10-2 Fire hazard testing – Part 10-2: Abnormal heat – Ball pressure test method - Edition 3.0
- IEC 60335-2-12 Household and similar electrical appliances – Safety – Part 2-12: Particular requirements for warming plates and similar appliances - Edition 5.1 Consolidated Reprint
- IEC 60034-1 Rotating electrical machines – Part 1: Rating and performance - Edition 12.0
- BSI BS EN 61800-2 Adjustable Speed Electrical Power Drive Systems - Part 2: General Requirements - Rating Specifications for Low Voltage Adjustable Speed a.c. Power Drive Systems - Remains Current
- IEC 60747-1 Semiconductor devices – Part 1: General - Edition 2.1 Consolidated Reprint
- IEC 60747-16-1 Semiconductor devices – Part 16-1: Microwave integrated circuits – Amplifiers - Edition 1.1 Consolidated Reprint
- IEC 60747-1 Semiconductor devices – Part 1: General - Edition 2.1 Consolidated Reprint
- BSI BS EN 61800-2 Adjustable Speed Electrical Power Drive Systems - Part 2: General Requirements - Rating Specifications for Low Voltage Adjustable Speed a.c. Power Drive Systems - Remains Current
- IEC 60034-1 Rotating electrical machines – Part 1: Rating and performance - Edition 12.0
- BSI BS EN 61800-2 Adjustable Speed Electrical Power Drive Systems - Part 2: General Requirements - Rating Specifications for Low Voltage Adjustable Speed a.c. Power Drive Systems - Remains Current
- IEC 60747-1 Semiconductor devices – Part 1: General - Edition 2.1 Consolidated Reprint
- IEC 60747-16-1 Semiconductor devices – Part 16-1: Microwave integrated circuits – Amplifiers - Edition 1.1 Consolidated Reprint
- IEC 60747-1 Semiconductor devices – Part 1: General - Edition 2.1 Consolidated Reprint
- IEC 60747-16-1 Semiconductor devices – Part 16-1: Microwave integrated circuits – Amplifiers - Edition 1.1 Consolidated Reprint
- IEC 60747-16-4 Semiconductor devices – Part 16-4: Microwave integrated circuits – Switches - Edition 1.1 Consolidated Reprint
- BSI BS EN 60747-16-1 + A1 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers - AMD: April 30, 2008
- BSI BS EN 60747-16-4 + A1 Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches - AMD: July 31, 2011
- IEC 60747-4 Semiconductor devices – Discrete devices – Part 4: Microwave diodes and transistors - Edition 2.0
- JSA JIS C 7551-1 Incandescent lamps - Safety specifications - Part 1: Tungsten filament lamps for domestic and similar general lighting purposes
- Картотека зарубежных и международных стандартов
International Electrotechnical Commission
Semiconductor devices – Discrete devices – Part 8: Field-effect transistors - Edition 3.0
N 60747-8
Annotation
This part of IEC 60747 gives standards for the following categories of field-effect transistors:
– type A: junction-gate type;
– type B: insulated-gate depletion (normally on) type;
– type C: insulated-gate enhancement (normally off) type.
NOTE 1 Schottky barrier-gate and insulated gate devices include depletion type devices and enhancement type devices.
NOTE 2 MOSFETs for some applications may not have inverse diode characteristics in the data sheet. Special circuit element structures to eliminate body diode are under development for such applications. MOSFET applications such as motor control equipment need to specify the inverse diode characteristics in the MOSFET to use the inverse diode as a free wheeling diode.
NOTE 3 The graphical symbol only for type C is used in this standard. The standard equally applies for P-channel and for type A and B devices.
Автоматический перевод:
Полупроводниковые устройства – Дискретные устройства – Часть 8: Канальные транзисторы - Выпуск 3.0
Эта часть IEC 60747 дает стандарты для следующих категорий канальных транзисторов:



