IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- 31
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- 31.140
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-11 Measurement of quartz crystal unit parameters – Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction - Edition 1.0
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-11 Measurement of quartz crystal unit parameters – Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction - Edition 1.0
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- IEC 60122-2-1 AMD 1 Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- IEC 60444-6 Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD) - Edition 2.0
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- Картотека зарубежных и международных стандартов
На него ссылаются
- В списке элементов: 7
- CEI EN 60444-6 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)Измерение Части 6 параметров модуля кристалла кварца: Измерение зависимости уровня диска (DLD)
Карточка документа - DIN EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2013)Измерение параметров модуля кристалла кварца - Часть 6: Измерение зависимости уровня диска (DLD) (60444-6:2013 IEC)
Карточка документа - BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)Измерение параметров модуля кристалла кварца - часть 6: измерение Зависимости уровня диска (DLD)
Карточка документа - CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)Измерение параметров модуля кристалла кварца - Часть 6: Измерение зависимости уровня диска (DLD)
Карточка документа - IEC 60444-6 Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD) - Edition 2.0Измерение параметров модуля кристалла кварца – Часть 6: Измерение зависимости уровня диска (DLD) - Выпуск 2.0
Карточка документа - BSI BS EN 60122-3 Quartz crystal units of assessed quality Part 3: Standard outlines and lead connectionsМодули кристалла кварца оцененной качественной Части 3: Стандарт обрисовывает в общих чертах и ведущие соединения
Карточка документа - CENELEC EN 60122-3 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connectionsМодули кристалла кварца оцененного качества - Часть 3: Стандарт обрисовывает в общих чертах и ведущие соединения
Карточка документа
