ASTM D7035 Standard Test Method for Determination of Metals and Metalloids in Airborne Particulate Matter by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
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ASTM International
Standard Test Method for Determination of Metals and Metalloids in Airborne Particulate Matter by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
N D7035
Annotation
This test method specifies a procedure for collection, sample preparation, and analysis of airborne particulate matter for the content of metals and metalloids using inductively coupled plasma-atomic emission spectrometry (ICP-AES).
This test method is applicable to personal sampling of the inhalable or respirable fraction of airborne particles and to area sampling.
This test method should be used by analysts experienced in the use of ICP-AES, the interpretation of spectral and matrix interferences, and procedures for their correction.
This test method specifies a number of alternative methods for preparing test solutions from samples of airborne particulate matter. One of the specified sample preparation methods is applicable to the measurement of soluble metal or metalloid compounds. Other specified methods are applicable to the measurement of total metals and metalloids.
It is the user’s responsibility to ensure the validity of this test method for sampling materials of untested matrices.
The following is a non-exclusive list of metals and metalloids for which one or more of the sample dissolution methods specified in this document is applicable. However, there is insufficient information available on the effectiveness of dissolution methods for those elements in italics.
This test method is not applicable to the sampling of elemental mercury, or to inorganic compounds of metals and metalloids that are present in the gaseous or vapor state.
No detailed operating instructions are provided because of differences among various makes and models of suitable ICP-AES instruments. Instead, the analyst shall follow the instructions provided by the manufacturer of the particular instrument. This test method does not address comparative accuracy of different devices or the precision between instruments of the same make and model.



