International Organization for Standardization

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy - Second Edition
 N 22489

Annotation

This International Standard specifies requirements for the quantification of elements in a micrometresized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).

This International Standard also describes the following:

— the principle of the quantitative analysis;

— the general coverage of this technique in terms of elements, mass fractions and reference specimens;

— the general requirements for the instrument;

— the fundamental procedures involved such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these and the report.

This International Standard is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used

Автоматический перевод:

Анализ микролуча - Электронно-зондовый анализ - Количественный анализ пункта для оптовых экземпляров с помощью длины волны дисперсионная Рентгеноспектроскопия - Второй Выпуск