DIN EN 62878-1-1 Device embedded substrate - Part 1-1: Generic specification - Test methods (IEC 62878-1-1:2015)
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- 19
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- 19.040
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- 29
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- 29.020
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- AENOR UNE-EN 60068-2-2 Environmental testing -- Part 2-2: Tests - Tests B: Dry heat. (IEC 60068-2-2:2007)
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- AENOR UNE-EN 50130-5 Alarm systems - Part 5: Environmental test methods
- IEC 60068-3-8 Environmental testing Part 3-8: Supporting documentation and guidance Selecting amongst vibration tests - Edition 1.0
- CEI EN 60068-2-57 Environmental testing Part 2-57: Tests - Test Ff: Vibration - Time-history and sine-beat method
- CEI EN 60068-1 Environmental testing Part 1: General and guidance
- AENOR UNE-EN 60068-3-7 Environmental testing -- Part 3-7: Supporting documentation and guidance - Measurements in temperature chambers for tests A and B (with load).
- Картотека зарубежных и международных стандартов
Deutsches Institut fur Normung e. V.
Device embedded substrate - Part 1-1: Generic specification - Test methods (IEC 62878-1-1:2015)
N EN 62878-1-1
Annotation
Dieser Teil von IEC 62878 legt die Prufverfahren fur Tragermaterialien mit eingebetteten passiven und aktiven Bauteilen fest. Die grundlegenden Prufverfahren fur die Leiterplattenmaterialien und die Trager selbst sind in IEC 61189-3 festgelegt.
Dieser Teil von IEC 62878 gilt fur Tragermaterialien mit eingebetteten Bauteilen, die unter Verwendung von organischen Basismaterialien gefertigt sind und zum Beispiel aktive oder passive Bauteile, im Fertigungsprozess elektronischer Leiterplatten gebildete Einzelbauelemente sowie Dunnschichtbauteile enthalten.
Die Normenreihe IEC 62878 gilt weder fur Umverdrahtungslagen (RDL, en: re-distribution layer) noch fur Elektronikmodule, die nach IEC 62421 als Geschaftsmodell Typ M definiert werden.
Автоматический перевод:
Устройство включило подложку - Часть 1-1: Универсальная спецификация - Методы испытаний (IEC 62878-1-1:2015)
Эта часть Международной комиссии по электротехнике 62 878 вкладывает методы испытания для несущих материалов при помощи заделанных пассивных и активных конструктивных элементов. Основные методы испытания для материалов дисков руководителя и носителей вложены в Международную комиссию по электротехнике 61189-3.
