ASTM E983 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
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Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
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- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
- 71.040
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
- 71.040.40
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- ISO 18115-1 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
- 01
- ISO 18115-1 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
- ISO 18115-1 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy - First Edition
- ISO 16531 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS - First Edition
- ISO 14606 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials - Second edition
- ASTM E1127 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
- ASTM E996 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ISO 14606 Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials - First Edition
- Картотека зарубежных и международных стандартов
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- ISO 18118 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials - Second EditionПоверхностный химический анализ - спектроскопия Оже-электрона и фотоэлектронная спектроскопия Рентгеновских лучей - Справочник по использованию экспериментально решительных относительных факторов чувствительности для количественного анализа гомогенных материалов - Второй Выпуск
Карточка документа - ASTM E1078 Standard Guide for Specimen Preparation and Mounting in Surface AnalysisТипичный гид для подготовки к экземпляру и повышающийся в поверхностном анализе
Карточка документа - ASTM E984 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron SpectroscopyТипичный гид для идентификации химических эффектов и матричных эффектов в спектроскопии электрона сверла
Карточка документа - ASTM E827 Standard Practice for Identifying Elements by the Peaks in Auger Electron SpectroscopyОбщепринятая практика для идентификации элементов пиками в спектроскопии электрона сверла
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