ISO 20903 Surface chemical analysis — Auger electron spectroscopy and X?ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results - Second Edition
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37.040
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37.040.20
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 01
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2530 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si (111) Monatomic Steps
- ISO ISO/TR 18196 Nanotechnologies - Measurement technique matrix for the characterization of nano-objects - First Edition
- Картотека зарубежных и международных стандартов
International Organization for Standardization
Surface chemical analysis — Auger electron spectroscopy and X?ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results - Second Edition
N 20903
Annotation
This International Standard specifies the necessary information required in a report of analytical results based on measurements of the intensities of peaks in Auger electron and X-ray photoelectron spectra. Information on methods for the measurement of peak intensities and on uncertainties of derived peak areas is also provided.
Автоматический перевод:
Поверхностный химический анализ — спектроскопия электрона Сверла и фотоэлектронная спектроскопия X ray — Методы раньше определяли пиковую интенсивность, и информация потребовала при создании отчетов о результатах - Второй Выпуск
Этот Международный стандарт определяет необходимую информацию, запрошенную в отчете аналитических результатов на основе измерений интенсивности пиков в электроне Оже и спектрах фотоэлектрона рентгена. Информация о методах для измерения пиковой интенсивности и на неуверенности в полученных пиковых областях также предоставляется.
