CENELEC EN 60444-8 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
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Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
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- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- 31.140
- CENELEC EN 60444-5 Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- CENELEC EN 60444-11 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- IEC 60444-5 Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction - Edition 1.0
- BSI BS EN 60444-6 Measurement of Quartz Crystal Unit Parameters - Part 6: Measurement of Drive Level Dependence (DLD)
- IEC 60444-8 Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units - Edition 1.0
- CENELEC EN 60444-6 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- Картотека зарубежных и международных стандартов
European Committee for Electrotechnical Standardization
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
N EN 60444-8
Автоматический перевод:
Измерение Части 8 параметров модуля кристалла кварца: Тестовое приспособление для поверхности смонтировало модули кристалла кварца
Эквиваленты данного стандарта:
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