CEI EN 62276 Single crystal wafers for surface acoustic wave (SAW) devices applications - Specifications and measuring method
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
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- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
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- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
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- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
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- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- CSA CAN/CSA-E61347-1:03 Lamp controlgear – Part 1: General and safety requirements - First Edition
- IEC TR 60479-4 Effects of current on human beings and livestock – Part 4: Effects of lightning strokes - Edition 2.0
- IEC TS 60479-1 CORR 2 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 2 - Edition 4.0
- IEC 61230 Live working – Portable equipment for earthing or earthing and short-circuiting - Edition 2.0
- IEC TS 60479-1 CORR 1 Effects of current on human beings and livestock – Part 1: General aspects CORRIGENDUM 1 - Edition 4.0
- Картотека зарубежных и международных стандартов
Comitato Elettrotecnico Italiano
Single crystal wafers for surface acoustic wave (SAW) devices applications - Specifications and measuring method
N EN 62276
Annotation
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
Автоматический перевод:
Пластины монокристалла для приложений устройств поверхностной акустической волны (SAW) - Спецификации и измеряющийся метод
Этот Международный стандарт применяется к изготовлению синтетического кварца, литиевого ниобата (LN), литиевого танталита (LT), лития tetraborate (LBO) и пластин монокристалла силиката галлия лантана (LGS), предназначенных для использования в качестве подложек в производстве фильтров поверхностной акустической волны (SAW) и резонаторов.
Эквиваленты данного стандарта:
- IEC 62276 Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods - Edition 2.0
- CENELEC EN 62276 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- BSI BS EN 62276 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
