BSI BS EN 111000 Harmonized system of quality assessment for electronic components Generic specification: Cathode ray tubes - AMD 6004: July 1992; AMD 7600: March 15, 1993
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Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
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- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- 03.100
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- 03.100.50
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 113000 Harmonized system of quality assessment for electronic components Generic specification - Camera tubes - AMD 7573: February 15, 1993
- BSI BS 448-1 Dimensions of Electronic Tubes and Valves Part 1: IEC Dimensions - AMD 5998: September 15, 1992
- BSI BS EN 111101 Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Display storage tubes - AMD 9097: August 15, 1996
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- Картотека зарубежных и международных стандартов
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- IEC 60139 Preparation of Outline Drawings for Cathode-Ray Tubes, Their Components, Connections and Gauges - Edition 2.0Подготовка контурных рисунков для электронно-лучевых трубок, их компонентов, соединений и приборов - выпуск 2.0
Карточка документа - IEC 60236 Methods for the Designation of Electrostatic Deflecting Electrodes of Cathode-Ray Tubes - Edition 2.0Методы для обозначения электростатических отклоняющих электродов электронно-лучевых трубок - выпуск 2.0
Карточка документа - IEC 60151-1 Measurements of the Electrical Properties of Electronic Tubes and Valves Part 1: Measurement of Electrode Current - Edition 1.0Измерения электрических свойств электронной части 1 трубок и клапанов: измерение электродного тока - выпуск 1.0
Карточка документа - IEC 60151-2 Measurements of the Electrical Properties of Electronic Tubes and Valves Part 2: Measurement of Heater or Filament Current - Edition 1.0Измерения электрических свойств электронной части 2 трубок и клапанов: измерение нагревателя или тока накала - выпуск 1.0
Карточка документа - IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969Методы для измерения прямых межэлектродных емкостей электронных трубок и клапанов - выпуск 2.0; включает поправку 1: 11/1969
Карточка документа - IEC 60134 Rating Systems for Electronic Tubes and Valves and Analogous Semiconductor Devices - Edition 1.0Системы оценки для электронных трубок и клапанов и аналогичных полупроводниковых устройств - выпуск 1.0
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