IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
Список продуктов
Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- 03
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- 03.100
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- 03.100.50
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- IEC QC 001004 International Electrotechnical Commission Quality Assessment System for Electronic Components (IECQ) - Specifications List - Issue 1; Edition 2.0
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS QC 300203 Specification for Harmonized system of quality assessment for electronic components - AMD 5947: September 1988
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS 9000-3 General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- BSI BS EN 114000 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- IEC 60100 Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
- BSI BS EN 113000 Harmonized system of quality assessment for electronic components Generic specification - Camera tubes - AMD 7573: February 15, 1993
- BSI BS 448-1 Dimensions of Electronic Tubes and Valves Part 1: IEC Dimensions - AMD 5998: September 15, 1992
- BSI BS EN 111101 Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Display storage tubes - AMD 9097: August 15, 1996
- IEC TS 62239 Process management for avionics Preparation of an electronic components management plan - Edition 1.0
- Картотека зарубежных и международных стандартов
International Electrotechnical Commission
Methods for the Measurement of Direct Interelectrode Capacitances of Electronic Tubes and Valves - Edition 2.0; Includes Amendment 1: 11/1969
N 60100
Annotation
This recommendation covers the measurement of direct interelectrode capacitances of tubes and valves within the conditions outlined in Clause 4 fir the following classes:
Receiving tubes and valves
Cathode-ray tubes
Gas tubes and gas-filled valves
Phototubes, photocells and multiplier types
High-power vacuum tubes and valves
Автоматический перевод:
Методы для измерения прямых межэлектродных емкостей электронных трубок и клапанов - выпуск 2.0; включает поправку 1: 11/1969
Эта рекомендация касается измерения прямых межэлектродных емкостей трубок и клапанов в условиях, обрисованных в общих чертах в ели Пункта 4 следующие классы:
Получение трубок и клапанов
Электронно-лучевые трубки
