ASTM F1443 Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images
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ASTM International
Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images
N F1443
Annotation
This practice covers the use of the reflectance-type optical character testers with a 0.008-in. (0.203-mm) aperture as test instruments for measuring image quality.
Although other systems may be available, this practice covers two of the most commonly used instruments; the Clearwave 082 Optical Character Tester2 and the Macbeth Print Contrast Meter.3
These instruments also have the capability of predicting machine readability of documents. This practice does not address this capability.
The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2 The sole source of supply of the apparatus known to the committee at this time is Clearwave Inc., 8701 Buffalo Ave., Niagara Falls, NY 14304 (formerly manufactured by Moore). If you are aware of alternative suppliers, please provide this information to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsible technical committee,1 which you may attend.
3 The sole source of supply of the apparatus known to the committee at this time is Macbeth, Division of Kollmorgen Instruments Corp., 405 Little Britain Rd., New Windsor, NY 12553-6148. If you are aware of alternative suppliers, please provide this information to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsible technical committee,1 which you may attend.



