IEC 60748-20-1 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Section 1: Requirements for Internal Visual Examination - Edition 1.0
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- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- BSI BS QC 760101 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of Qualification Approval Procedures
- 31
- BSI BS QC 760101 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of Qualification Approval Procedures
- 31.200
- BSI BS QC 760101 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of Qualification Approval Procedures
- BSI BS QC 760201 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760200 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760201 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760200 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760201 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Blank Detail Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760200 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- BSI BS QC 760200 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- IEC 60748-20-1 Semiconductor Devices - Integrated Circuits - Part 20: Generic Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits - Section 1: Requirements for Internal Visual Examination - Edition 1.0
- BSI BS QC 760100 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Qualification Approval Procedures
- Картотека зарубежных и международных стандартов
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Карточка документа - BSI BS QC 760100 Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Integrated Circuits - Sectional Specification for Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Qualification Approval ProceduresСогласованная система качественной оценки для устройств полупроводника электронных компонентов - интегральных схем - частная спецификация для пленочных интегральных схем и гибридных пленочных интегральных схем на основе процедур одобрения квалификации
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