ISO 20998-2 Measurement and characterization of particles by acoustic methods - Part 2: Guidelines for linear theory - First Edition
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Данный раздел/документ содержится в продуктах:
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
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- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37.040
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37.040.20
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2530 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si (111) Monatomic Steps
- ISO ISO/TR 18196 Nanotechnologies - Measurement technique matrix for the characterization of nano-objects - First Edition
- ISO 20998-2 Measurement and characterization of particles by acoustic methods - Part 2: Guidelines for linear theory - First Edition
- ISO 20998-1 Measurement and characterization of particles by acoustic methods Part 1: Concepts and procedures in ultrasonic attenuation spectroscopy - First Edition
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- Картотека зарубежных и международных стандартов
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- В списке элементов: 5
- ISO 9276-2 Representation of results of particle size analysis - Part 2: Calculation of average particle sizes/diameters and moments from particle size distributions - Second EditionПредставление результатов анализа размера частиц - Часть 2: Вычисление средних размеров/диаметров частицы и моменты от гранулометрических составов - Второй Выпуск
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Карточка документа - ISO 20998-1 Measurement and characterization of particles by acoustic methods Part 1: Concepts and procedures in ultrasonic attenuation spectroscopy - First EditionИзмерение и характеристика частиц акустической Частью 1 методов: Понятия и процедуры в сверхзвуковой спектроскопии затухания - Первый Выпуск
Карточка документа - ISO GUIDE 35 Reference materials - General and statistical principles for certification - Third EditionСправочные материалы - Общие и статистические принципы для сертификации - Третий Выпуск
На основе ISO GUIDE 35 разработаны ГОСТ Р 8.694-2010 (MOD); ГОСТ ISO Guide 35-2015 (IDT)ГОСТ ISO Guide 35-2015 (IDT) - ISO 14887 Sample Preparation - Dispersing Procedures for Powders in Liquids - First EditionТиповая подготовка - рассеивающиеся процедуры для порошков в жидкостях - первый выпуск
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