Japanese Standards Association

Environmental testing - Part 2-27: Tests - Test Ea: Shock
 N JIS C 60068-2-27

Annotation

This Standard specifies the shock test for components, equipments, and other electrotechnical products (hereafter referred to as "specimens") which during transportation, storage and handling, or in use, may be subjected either to conditions involving relatively infrequent non-repetitive 1) or repetitive 2) shocks.

Notes 1) Non-repetitive shock tests were referred to as "shock tests in JIS C 60068-27 : 1995, before the revision.

2) Repetitive shock tests were referred to as "bump tests" in JIS C 60068-2-29, which was withdrawn when this Standard was revised.

The shock test basically consists of subjecting a specimen either to non-repetitive or repetitive shocks of standard pulse shapes with specified peak acceleration and duration.

The purpose of this test is to reveal mechanical weakness and/or degradation in specified performances, or accumulated damage or degradation caused by shocks. In conjunction with the relevant specification, this may be used in some cases to determine the structural integrity of specimens or as a means of quality control (see clause A.2).

This test is primarily intended for unpackaged specimens and for items in their transport case. When used in conjunction with JIS C 60068-2-47, this Standard may be used for testing packaged products. If an item is to be tested unpackaged, it is referred to as a test specimen. However, if the item is packaged, then the item itself is referred to as a product and the item and its packaging together are referred to as a test specimen.

NOTE 1 As for mounting method of packaged products, see JIS C 60068-2-47.