ISO TS 10868 Nanotechnologies — Characterization of single-wall carbon nanotubes using ultraviolet-visible-near infrared (UV-Vis-NIR) absorption spectroscopy - First Edition
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
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- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37.040
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 37.040.20
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- 01
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2530 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si (111) Monatomic Steps
- ISO ISO/TR 18196 Nanotechnologies - Measurement technique matrix for the characterization of nano-objects - First Edition
- ISO TS 17466 Use of UV-Vis absorption spectroscopy in the characterization of cadmium chalcogenide colloidal quantum dots - First Edition
- ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- Картотека зарубежных и международных стандартов
International Organization for Standardization
Nanotechnologies — Characterization of single-wall carbon nanotubes using ultraviolet-visible-near infrared (UV-Vis-NIR) absorption spectroscopy - First Edition
N TS 10868
Annotation
This Technical Specification provides guidelines for the characterization of compounds containing single-wall carbon nanotubes (SWCNTs), using optical absorption spectroscopy.
The purpose of this Technical Specification is to describe a measurement method for establishing the diameter, purity, and ratio of metallic SWCNTs to the total SWCNT content in the sample.
The analysis of the diameter is applicable to a diameter range of 1 nm to 2 nm.
Автоматический перевод:
Нанотехнологии — Характеристика углеродных нанотрубок единственной стены с помощью ультрафиолетово-видимо-близкой инфракрасной абсорбционной спектроскопии (UV-Vis-NIR) - Первый Выпуск
Эта Техническая характеристика обеспечивает инструкции для характеристики составов, содержащих углеродные нанотрубки единственной стены (SWCNTs), с помощью оптической абсорбционной спектроскопии.
Цель этой Технической характеристики состоит в том, чтобы описать измерительный метод для установления диаметра, чистоты и отношения металлического SWCNTs к общему содержанию SWCNT в образце.
