ASTM E2382 Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
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Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM F1438 Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
- DIN ISO 12853 Optics and optical instruments - Microscopes - Information provided to the user (ISO 12853:1997)
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- VDI VDI/VDE 2655 BLATT 1.1 Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
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- VDI VDI/VDE 2655 BLATT 1.1 Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
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- VDI VDI/VDE 2656 BLATT 1 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
- ASTM E1813 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
- Картотека зарубежных и международных стандартов
ASTM E2382 Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
