DLA SMD-5962-90749 REV C MICROCIRCUIT, DIGITAL, , BIPOLAR CMOS, OCTAL BUFFER AND LINE DRIVER WITH NONINVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- 29
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- 29.035
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- 29.035.50
- ASTM F105 Standard Specification for Type 58 Borosilicate Sealing Glass
- ASTM F140 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM F140 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
- ASTM F140 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- ASTM D116 Standard Test Methods for Vitrified Ceramic Materials for Electrical Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- DLA MIL-STD-883K CHANGE 1 TEST METHOD STANDARD MICROCIRCUITS
- Картотека зарубежных и международных стандартов
CC - DLA Land and Maritime
MICROCIRCUIT, DIGITAL, , BIPOLAR CMOS, OCTAL BUFFER AND LINE DRIVER WITH NONINVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
N SMD-5962-90749 REV C
Annotation
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
Автоматический перевод:
МИКРОСХЕМА, ЦИФРОВОЙ, БИПОЛЯРНЫЙ CMOS, ВОСЬМЕРИЧНЫЙ БУФЕР И ВОДИТЕЛЬ ЛИНИИ С НЕИНВЕРТИРОВАНИЕМ ВЫВОДОВ С ТРЕМЯ ГОСУДАРСТВАМИ, TTL СОВМЕСТИМЫЕ ВВОДЫ, МОНОЛИТНЫЙ КРЕМНИЙ
Этот рисунок документы два уровня класса управления качеством продуктов, состоящие из высокой надежности (класс устройства Q и M) и приложение пространства (класс устройства V). Выбор основ случая и ведущих концов доступен и отражается в Числе Части или Идентификации (PIN). Когда доступно, выбор уровней Radiation Hardness Assurance (RHA) отражается в PIN.
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