DLA SMD-5962-98613 REV L MICROCIRCUIT, LINEAR, RADIATION HARDENED, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- 29
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- 29.035
- ASTM D1039 Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
- 29.035.50
- ASTM F105 Standard Specification for Type 58 Borosilicate Sealing Glass
- ASTM F140 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM F140 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
- ASTM F140 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM F79 Standard Specification for Type 101 Sealing Glass
- ASTM D257 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- ASTM D116 Standard Test Methods for Vitrified Ceramic Materials for Electrical Applications
- ASTM D2149 Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Dielectrics At Frequencies To 10 MHz And Temperatures To 500°C
- ASTM D2442 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
- DLA MIL-STD-883K CHANGE 1 TEST METHOD STANDARD MICROCIRCUITS
- Картотека зарубежных и международных стандартов
CC - DLA Land and Maritime
MICROCIRCUIT, LINEAR, RADIATION HARDENED, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON
N SMD-5962-98613 REV L
Annotation
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer’s Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.
Автоматический перевод:
МИКРОСХЕМА, ЛИНЕЙНАЯ, ИЗЛУЧЕНИЕ УКРЕПЛЕННЫЙ, КВАДРАТИЧЕСКИЙ КОМПАРАТОР НАПРЯЖЕНИЯ, МОНОЛИТНЫЙ КРЕМНИЙ
Этот рисунок документы три уровня класса управления качеством продуктов, состоящие из высокой надежности (класс устройства Q), расположите приложение с интервалами (класс устройства V) и для соответствующих спутниковых и подобных приложений (класс устройства T). Выбор основ случая и ведущих концов доступен и отражается в Числе Части или Идентификации (PIN). Когда доступно, выбор уровней Radiation Hardness Assurance (RHA) отражается в PIN. Для класса устройства T пользователь призван рассмотреть план Управления качеством (QM) производителя как часть их оценки этих частей и их приемлемости в применении по назначению.
