ASTM E995 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
- ISO 17973 Surface Chemical Analysis - Medium-Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental Analysis - First Edition
- 71
- ISO 17973 Surface Chemical Analysis - Medium-Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental Analysis - First Edition
- 71.040
- ISO 17973 Surface Chemical Analysis - Medium-Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental Analysis - First Edition
- 71.040.40
- ISO 18118 Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials - First Edition
- ISO 18118 Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials - First Edition
- ISO 18118 Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials - First Edition
- BSI BS ISO 24236 Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale
- ISO 18118 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials - Second Edition
- Картотека зарубежных и международных стандартов
ASTM International
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
N E995
Annotation
The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.
This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).
The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Автоматический перевод:
Типичный гид для фоновых методов вычитания в спектроскопии фотоэлектрона спектроскопии и рентгеновских лучей электрона сверла
Цель этого руководства состоит в том, чтобы ознакомить аналитика из основных фоновых методов вычитания в настоящее время в использовании вместе с природой их приложения к сбору данных и управлению.
Это руководство предназначается для применения к фоновому вычитанию в электроне, рентгене, и взволнованной ионом Спектроскопии электрона сверла (AES) и Спектроскопии фотоэлектрона рентгена (XPS).



