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ASTM D6431 Standard Guide for Using the Direct Current Resistivity Method for Subsurface Investigation

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ASTM International

Standard Guide for Using the Direct Current Resistivity Method for Subsurface Investigation
 N D6431

 

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Purpose and Application:

This guide summarizes the equipment, field procedures, and interpretation methods for the assessment of the electrical properties of subsurface materials and their pore fluids, using the direct current (DC) resistivity method. Measurements of the electrical properties of subsurface materials are made from the land surface and yield an apparent resistivity. These data can then be interpreted to yield an estimate of the depth, thickness, and resistivity of subsurface layer(s).

Resistivity measurements as described in this guide are applied in geological, geotechnical, environmental, and hydrologic investigations. The resistivity method is used to map geologic features such as lithology, structure, fractures, and stratigraphy; hydrologic features such as depth to water table, depth to aquitard, and ground water salinity; and to delineate ground water contaminants. General references are, Keller and Frischknecht (1),2 Zohdy et al (2), Koefoed (3), EPA (4), Ward (5), Griffiths and King (6), and Telford et al (7).

Limitations:

This guide provides an overview of the Direct Current Resistivity Method. It does not address in detail the theory, field procedures, or interpretation of the data. Numerous references are included for that purpose and are considered an essential part of this guide. It is recommended that the user of the resistivity method be familiar with the references cited in the text and with the Guide D420, Practice D5088, Practice D5608, Guide D5730, Test Method G57, D6429, and D6235.

This guide is limited to the commonly used approach for resistivity measurements using sounding and profiling techniques with the Schlumberger, Wenner, or dipole-dipole arrays and modifications to those arrays. It does not cover the use of a wide range of specialized arrays. It also does not include the use of spontaneous potential (SP) measurements, induced polarization (IP) measurements, or complex resistivity methods.

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