ISO 13383-2 Fine ceramics (advanced ceramics, advanced technical ceramics) - Microstructural characterization - Part 2: Determination of phase volume fraction by evaluation of micrographs - First Edition
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- ASTM E2207 Standard Practice for Strain-Controlled Axial-Torsional Fatigue Testing with Thin - Walled Tubular Specimens
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- ASTM E1417/E1417M Standard Practice for Liquid Penetrant Testing
- ASTM F2094/F2094M Standard Specification for Silicon Nitride Bearing Balls
- CEN EN 843-1 Advanced Technical Ceramics - Monolithic Ceramics - Mechanical Properties at Room Temperature Part 1: Determination of Flexural Strength
- ASTM F2094/F2094M Standard Specification for Silicon Nitride Bearing Balls
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- CEN EN 843-1 Advanced Technical Ceramics - Monolithic Ceramics - Mechanical Properties at Room Temperature Part 1: Determination of Flexural Strength
- CEN EN 843-1 Advanced Technical Ceramics - Monolithic Ceramics - Mechanical Properties at Room Temperature Part 1: Determination of Flexural Strength
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- Картотека зарубежных и международных стандартов
International Organization for Standardization
Fine ceramics (advanced ceramics, advanced technical ceramics) - Microstructural characterization - Part 2: Determination of phase volume fraction by evaluation of micrographs - First Edition
N 13383-2
Annotation
This part of ISO 13383 specifies a manual method of making measurements for the determination of the volume fraction of major phases in fine ceramics (advanced ceramics, advanced technical ceramics) using micrographs of polished and etched sections, overlaying a square grid of lines, and counting the number of intersections lying over each phase.
NOTE 1 This method assumes that the true phase volume fractions are equivalent to area fractions on a randomly cut cross-section according to stereological principles.
NOTE 2 Guidelines for polishing and etching of advanced technical ceramics can be found in Annexes A and B of ISO 13383-1:2012.
The method applies to ceramics with one or more distinct secondary phases, such as found in Al2O3/ZrO2, Si/SiC, or Al2O3/SiCw.
If the test material contains discrete pores, these are to be treated as a secondary phase for the purpose of this method, provided that there is no evidence of grain pluck-out during polishing being confused with genuine pores.
NOTE 3 If the material contains more than about 20 % porosity, there is a strong risk that the microstructure will be damaged during the polishing process, and measurement of the volume fraction of pores may become misleading. Secondary phase volume fractions or porosity present at levels of less than 0,05 are subject to considerable error and potential scatter in results. A larger number of micrographs than the minimum of three is normally needed to improve the consistency and accuracy of the results.



