ASTM International

Standard Guide for Handling Specimens Prior to Surface Analysis
 N E1829

Annotation

This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

Auger electron spectroscopy (AES),

X-ray photoelectron spectroscopy (XPS or ESCA), and

Secondary ion mass spectrometry (SIMS).

Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, lowenergy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surfacesensitive measurements.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Автоматический перевод:

Типичный гид для обработки экземпляров до поверхностного анализа

Этот гид покрывает обработку экземпляра и подготовку до поверхностного анализа и обращается к следующим поверхностным аналитическим дисциплинам: