ISO 11505 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry - First Edition
Данный раздел/документ содержится в продуктах:
- Техэксперт: Машиностроительный комплекс
- Картотека зарубежных и международных стандартов
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- Картотека зарубежных и международных стандартов
International Organization for Standardization
Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry - First Edition
N 11505
Annotation
This International describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte element, and include results of interlaboratory tests for validation of the methods.
Автоматический перевод:
Поверхностный химический анализ - Общие процедуры для количественного композиционного профилирования глубины тлеющим разрядом оптическая спектрометрия эмиссии - Первый Выпуск
Это Международное описывает тлеющий разряд оптическая эмиссия спектральный метод (GD-OES) для определения толщины, массы на единицу площади и химического состава фильмов поверхностного слоя.



