IEC 60749-6 CORR 1 SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 6: Storage at high temperature CORRIGENDUM 1 - Edition 1.0
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International Electrotechnical Commission
SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 6: Storage at high temperature CORRIGENDUM 1 - Edition 1.0
N 60749-6 CORR 1
Автоматический перевод:
SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Часть 6: Устройство хранения данных при высокой температуре CORRIGENDUM 1 - Выпуск 1.0
Эквиваленты данного стандарта:
- BSI BS EN 60749-6 Semiconductor Devices Mechanical and Climatic Test Methods Part 6: Storage at High Temperature
- CENELEC EN 60749-6 Semiconductor Devices Mechanical and Climatic Test Methods Part 6: Storage at High Temperature
- AENOR UNE-EN 60749-6 Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature.
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