International Electrotechnical Commission

Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides - Edition 2.0
 N 61000-4-20

Annotation

Scope and object

This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.

The object of this standard is to describe

• TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;

• TEM waveguide validation methods for EMC tests;

• the EUT (i.e. EUT cabinet and cabling) definition;

• test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and

• test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

NOTE Test methods are defined in this standard for measuring the effects of electromagnetic radiation on equipment and the electromagnetic emissions from equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate repeatability of results at various test facilities for qualitative analysis of effects.